Park NX10 is a complete Atomic Force Microscope AFM system for general nanoscale imaging applications. It supports the following: Contact, non-contact and tapping mode. Electrostatic and magnetic force microscopy. The system is equipped with an acoustic enclosure with active vibration isolation. It uses the SmartScanTM operating software to produce high quality images. Automated or manual use, making initial training easier for multi-users.
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