Integrated Confocal Raman and TERS Microscope – Horiba LabRAM HR Evolution Nano

Horiba LabRAM HR Evolution Nano is an integrated confocal, tip-enhanced Raman system (TERS) and tip-enhanced photoluminescence (TEPL) microscope. It can be operated for (1) confocal Raman/PL spectroscopy and mapping (excitation wavelength available: 473nm, 532nm, 633nm, 785nm, 1064nm), and (2) Tip enhanced Raman/PL spectroscopy (TERS/TEPL) and mapping using integrated AFM (excitation wavelength available: 633nm, 785nm) for characterization of materials and defects with a resolution down to 10 nm. The integrated AFM options allow users to compare TERS and TEPL images with AFM topography, (photo)conductive, and Kelvin Probe Force Microscopy images for better understanding of the defects.