The 3D surface profiler VK-X3000 series offers both magnified observation and shape measurements with display resolution in height [z] (measurement range of 7 mm) and width [x/y] measurements up to 1 nm. It also possesses a measuring microscope that can analyze samples to quantify shape and roughness. The instrument employs two light sources: a short-wavelength laser source and a white light source. These two types of light sources enable acquisition of both laser intensity and color images, enabling the capture of fully focused and height/color map images. Film thickness measurements can be achieved from 80 μm (10x magnification) up to 3.5 μm (50x magnification) for transparent targets.
Click the link below to go to the equipment reservation page.